TSE

Journal Papers

1. Replicating and Re evaluating the Theory of Relative Defect Proneness
   Authors - Mark, D. Syer; Meiyappan, Nagappan; Bram, Adams and Ahmed, E. Hassan
   Preprint - PDF
   Related Tags -
   • TSE
   • Defect Prediction
   • 2014
2. The Impact of Classifier Configuration and Classifier Combination on Bug Localization
   Authors - Stephen, W. Thomas; Meiyappan, Nagappan; Dorothea, Blostein and Ahmed, E. Hassan
   Preprint - PDF
   Related Tags -
   • TSE
   • Bugs
   • Topic Models
   • 2013