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Journal Papers
Replicating and Re evaluating the Theory of Relative Defect Proneness
Authors
- Mark, D. Syer; Meiyappan, Nagappan; Bram, Adams and Ahmed, E. Hassan
Preprint
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TSE
Defect Prediction
2014
The Impact of Classifier Configuration and Classifier Combination on Bug Localization
Authors
- Stephen, W. Thomas; Meiyappan, Nagappan; Dorothea, Blostein and Ahmed, E. Hassan
Preprint
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PDF
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TSE
Bugs
Topic Models
2013