Efficient Multiple Instance Metric Learning using Weakly Supervised Data Jan 1, 2017· M. Law , Y. Yu , R. Urtasun , R. Zemel , E. Xing · 0 min read PDF Cite Type Conference paper Publication IEEE Conference on Computer Vision and Pattern Recognition (CVPR) Last updated on Jan 1, 2017 Conference ← Dropout with Expectation-Linear Regularization Jan 1, 2017 Generalized Conditional Gradient for Sparse Estimation Jan 1, 2017 →